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1 article(s) from Tsurekawa, Sadahiro

A new approach to grain boundary engineering for nanocrystalline materials

Shigeaki Kobayashi,
Sadahiro Tsurekawa and
Tadao Watanabe

Beilstein J. Nanotechnol. 2016, 7, 1829–1849, doi:10.3762/bjnano.7.176

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Figure 1: (a) The Vickers hardness as a function of the average grain size in electrodeposited and subsequent...

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Figure 2: Relationship between the Vickers hardness and the fraction of low-Σ CSL boundaries for the submicro...

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Figure 3: Relationship between the Vickers hardness and the fraction of R0 and R1 type triple junctions compo...

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Figure 4: SEM micrographs of cracks introduced by indentation tests in the sulfur-doped fine-grained Ni speci...

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Figure 5: S–N curves of nanocrystalline Ni–2.0 mass % P alloy specimens: (a) stress amplitude versus logarith...

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Figure 6: OIM micrographs with inverse pole figures (IPF) of grain orientation distribution for (A) prefatigu...

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Figure 7: Misorientation angle distributions for (a) prefatigued and (b) postfatigued Ni–2.0 mass % P alloy s...

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Figure 8: Specimen surface of electrodeposited nanocrystalline Ni–2.0 mass % P alloy specimen after high-cycl...

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Figure 9: (a) Schematic illustration of the mechanism of intergranular fatigue fracture at random boundaries ...

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Figure 10: (a) Definition of the fractal dimension of the maximum random boundary connectivity (MRBC) and (b) ...

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Figure 11: Relationship between the number of boxes N(η) for complete coverage of the maximum random boundary ...

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Figure 12: Relationship between the fractal dimension of MRBC and the length of MRBC.

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Figure 13: Relationship between the fractal dimension of the MRBC and the fraction of low-Σ boundaries F_Σ or r...

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Figure 14: SEM micrographs of the surface (a,c) and the cross section (b,d) for the corroded specimens with di...

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Figure 15: Schematic illustration showing the bulk mesoscopic propensity to percolation-related phenomena in t...

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Figure 16: (a–c) OIM micrographs with inverse pole figures (IPF) of grain orientation distribution and (d–f) g...

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Figure 17: Change in grain boundary character distribution in the sputtered gold thin film specimens after ann...

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Figure 18: Example of the fractal analysis by box counting method for spatial distribution of random boundarie...

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Figure 19: Relationship between the electrical resistivity and fractal dimension of spatial distribution of ra...

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Review

Published 25 Nov 2016

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